The Nanoscale World

Diference between deflection signal after the SAM and In0

rated by 0 users
Not Answered This post has 0 verified answers | 0 Replies | 1 Follower

Top 50 Contributor
19 Posts
Points 215
Luis posted on Tue, May 21 2013 10:46 PM

Hi, I was wondering why the deflection voltage obtained on the In0 channel of the Signal Access Module differs from the one shown by the software.  This was noted in a previous post:

http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/p/821/1992.aspx#1992

"Note that on nanoscope 3 and 4 systems, the cantilever deflection signal (as displayed in the software) is scaled after the SAM, so you will measure a different deflection voltage on the In0 channel of the SAM to that shown in the software. From my measurements, the software deflection is approximately 1.6 times the In0 value."

Thanks for your comments!

  • | Post Points: 10
Page 1 of 1 (1 items) | RSS
Copyright (c) 2011 Bruker Instruments