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Posted: Thu, Jun 3 2010 5:01 PM

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A Special, Cross-Platform, 3D Optical Surface Profilometry and Atomic Force Microscopy Webinar:

3D Optical Surface Profilometry and Atomic Force Microscopy for Ophthalmic Manufacturing

OVERVIEW

In the contact lens and intra-ocular lens (IOL) markets, the increasing demand from an aging population, the rapid material innovation and development, and a competitive landscape are drivin manufacturing growth and perfection. In such a dynamic environment, the requirements placed upon nanometer to micrometer scale metrology have been forcing manufacturers to look past the limits of traditional 2D stylus techniques and potentially dated Atomic Force Microscope (AFM) scan modes. Today's surface analysis instruments need to be both highly functional and easy-to-use, while helping to streamline production, increase yield and eliminate waste and scrap.

This webinar will focus on describing new, key enabling metrologies in both Atomic Force Microscopy and 3D surface profilometry for R&D, QA/QC, and production environments in the ophthalmology industry.

PRESENTER

Andrew Masters, VP Strategic Marketing and Business Development, Veeco Instruments, Inc.

TWO LIVE BROADCASTS - REGISTER TODAY!

Tuesday, June 15, 2010

8:30am PDT (11:30am EDT)

5:30pm PDT (8:30pm EDT)