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I have been using DI 3100 with nanoscope controller III for TPE phase imaging. Recently, I have started using Dimension V with Nanoscope V. I am having problem in getting phase image contrast in TPE system with Dimension V. I am using TESP with 10% offset frequency and setpoint ratio of .2-.5. The taget amplitude in DI V is 500 mV whereas in DI 3100 it is 2V. I m wondering if this difference leads to low force in DI V.
Is it ok to use high target amplitude in DI V and if yes whats the range?
Ray, 533 mVrms on an NSV corresponds to 2Vrms on the NSIII. You can of course change the traget amplitude to your liking. I would, however, suggest trying to use an FESP tip instead of the TESP if phase contrast on your polymer is your main concern.
Thanks Stefan for your suggestions. I tried using 600-700 mV rms depending on the sample. It worked fine uisng TESP.
Thanks