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Hello,
I have Dimension Icon AFM with extended TUNA module and have some issues regarding I-V measurement. I did current imaging on my sample using conductive AFm with bias voltage of 500 mV and current sensitivity of 100 nA/v. My sample is catalyst layer which is made of carbon black particles and nafion polymer. As expected, i see areas of high current (representing carbon particles) and low current (representing nafion) regions. The problems starts when i go to ramp mode and try to capture I-V curves. I am getting same I-V curves in both high and low current region. I looked into 20-25 other locations using ' point and shoot' mode, but i am getting same I-V curves. I don't understand why i don't see any variation in I-V curves.
Hi, Nishith,
What's your setting in ramp mode? You may send me your ramp files in single ramp as well as in point and shoot so I can check for you if anything you missed. My email is ang.li@bruker-nano.com
Ang Li
Hi Ang,
I had a similar problem. Would sending you the point and shoot images be enough for you to determine what parameters possibly need to be changed? I was ramping from -5 to +5V. How can I save the ramp files settings to send along?
Mithun
Hi, Mithun,
Sending me raw data is sufficient, all parameters will be attached in file header.