Nanoscratch on AFM

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barath posted on Thu, Apr 12 2012 3:14 PM

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I understand that the Nanolithography mode of the Innova AFM system can be used to make scratches on the surface. I was wondering if it is possible to track other signals during the scratching like normal force vs time, tangential force vs time, friction vs time and penetration depth/displacement with time.

 

 

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