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关于摩擦力和粘附力的测量

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Answered (Verified) This post has 1 verified answer | 16 Replies | 6 Followers

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hyangwit posted on Fri, Mar 29 2013 9:18 PM

孙博士，您好！

我们这有一台Multimode IIIa型AFM，我想问下如何用LFM模式测量材料的摩擦力，包括操作步骤和需要的探针什么的，要求是采用“trace-minus-retrace"方法得到数据。另外，粘附力和摩擦力如何区别。期待您的答复！

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Answered (Verified) Hao Sun replied on Tue, Apr 9 2013 4:42 AM
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可以，原理与做力曲线去计算作用力一样，只是需要知道横向的deflection sensitivity和弹性系数k，横向的校正比较难，请到本论坛的application notes板块下载AN094号文件参阅相关文献进行。

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Hao Sun replied on Sun, Apr 7 2013 6:51 AM

在Multimode上实现LFM很简单，只要选择contact模式，设置探针的扫描角度为90度，收集Friction通道的trace和retrace信号（Realtime plane fit设为none），最后将trace和retrace信号相减即可。在空气环境中测量时，不可避免的在contact模式下会出现由粘滞力导致的探针悬臂水平偏转，可以通过控制湿度或者在不影响表面特性的情况下，在液下测量。

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hyangwit replied on Sun, Apr 7 2013 8:15 AM

孙博士，您好，今天致电客服，李工说有一种分析软件可以直接将trace和retrace信息相减，可能我给他的邮箱地址错了，还没收到文件，如果您有的话麻烦给我发一份吧。我的邮箱地址是:hyangwit@163.com，谢谢！

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Hao Sun replied on Sun, Apr 7 2013 11:32 PM

李博士已发送

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wang zengze replied on Tue, Apr 9 2013 4:22 AM

请问孙博士，这个摩擦力可以定量测出吗？如果可以，方法是什么？

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Answered (Verified) Hao Sun replied on Tue, Apr 9 2013 4:42 AM
Verified by Hao Sun

可以，原理与做力曲线去计算作用力一样，只是需要知道横向的deflection sensitivity和弹性系数k，横向的校正比较难，请到本论坛的application notes板块下载AN094号文件参阅相关文献进行。

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Chao Liu replied on Tue, Apr 9 2013 9:15 AM

请问有application note关于仪器横向校正么？AN094给出的是torsional spring constant校正方法。 谢谢，孙工

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Answered (Not Verified) Hao Sun replied on Tue, Apr 9 2013 9:23 AM
Suggested by libby

Torsional k 即 Lateral k

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libby replied on Wed, Feb 12 2014 9:26 PM

我也想要測量LFM的資料

是否可以也傳給我

感激不盡!

MAIL: libby881010@yahoo.com.tw

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Hao Sun replied on Sun, Feb 16 2014 7:35 PM

楼上资料已发送

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shuai replied on Sun, Mar 29 2015 4:16 AM

孙博士，能不能给我一些有关multimode和TRmode的详细介绍，尤其是有关于摩擦力测量的部分。多谢了！

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Hao Sun replied on Sun, Mar 29 2015 10:17 PM

请留下邮箱

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WILL YOUNG replied on Mon, Apr 13 2015 7:42 AM

孙博士，我最近用AFM测摩擦和摩擦系数，

相关资料是否可以也傳給我

感激不盡!

sadaddas@126.com

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Hao Sun replied on Mon, Apr 13 2015 9:43 PM

摩擦力的定性测量只需要在contact模式下将扫描方向设置为与悬臂垂直，同时收集Trace与Retrace的Friction通道，然后在离线软件中将两个通道的数据相减即可。若要测量摩擦系数，需要知道摩擦力的实际数值和支持力的实际数值。因此需要校准悬臂横向和纵向的deflection sensitivity和弹性系数。纵向的校准非常简单，请参考力曲线测量的方法；横向的校准很复杂，请参考下列文献：

ØD.F. Ogletree, R.W. Carpick, M. Salmeron, "Calibration of frictional forces in atomic force microscopy", Rev. Sci. Instrum. 67 (1996) 3298-3306.
Ø
ØM. Varenberg, I. Etsion, G. Halperin, "An improved wedge calibration method for lateral force in atomic force microscopy", Rev. Sci. Instrum. 74 (2003) 3362-3367.
Ø

 

ØC.P. Green, H. Lioe, J.P. Cleveland, R. Proksch, P. Mulvaney, J.E. Sader, "Normal and torsional spring constants of atomic force microscope cantilevers", Rev. Sci. Instrum. 75 (2004) 1988-1996.
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WILL YOUNG replied on Mon, Apr 13 2015 9:52 PM

谢谢您如此及时的回复~

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