Forums
Bruker Media
Community Media
Bruker AFM Probes
SPM Digest
Application Notes
NanoTheater
Website
中文
Brochures & Datasheets
Publications
Probes Catalog
Events
Manuals & Documentation
Presentations
Guide to AFM Modes
News
Journal Club
Webinars & Video
Nanovations
Other
Hi, I was wondering why the deflection voltage obtained on the In0 channel of the Signal Access Module differs from the one shown by the software. This was noted in a previous post:
http://nanoscaleworld.bruker-axs.com/nanoscaleworld/forums/p/821/1992.aspx#1992
"Note that on nanoscope 3 and 4 systems, the cantilever deflection signal (as displayed in the software) is scaled after the SAM, so you will measure a different deflection voltage on the In0 channel of the SAM to that shown in the software. From my measurements, the software deflection is approximately 1.6 times the In0 value."
Thanks for your comments!