The Nanoscale World

CAFM

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Deepak posted on Tue, Jun 4 2013 2:23 AM

I have a query regarding CAFM measurements. During these measurements we apply a bias between the tip and the sample. This must result in an electrostatic force on the cantilever. Can this force be quantified in some manner and does this lead to a modification of the loading force during the measurement.

 

thanks

 

Deepak 

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