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Hi,
I have a false engagement problem when using multimodeV during topological scanning. I always get an error message (TM deflection delta is higher than 5V) resulting in false engage during approach. Initially, I think this is coming from improper cleavage of mica, but problem still exists on silicon and well cleaved mica. Any attempt to tip down or tip up for engagement is fail. Any solution to the problem? Please advice.
Thank you.
Hi:
Can you try first with the calibration sample?
What probe are you using?
Before engage, what RMS value are you getting?
What version are using for NanoScope software? 5.x, 6.x, 7.X or 8.X? Controller? NanoScope IIIA, IV, IVA or V?
Thanks
Miguel