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I am using tapping mode and a RTESPA probe to measure the surface topography of a nanoparticle film. The film consists of spherical nanoparticles that measure roughly 50 nm in diameter in the AFM image. Is this particle diameter accurate? Since the particle is significantly larger than the tip radius of 5 nm, I would expect error due to convolution to be less than 10%. Is this an accurate assumption? I appreciate any help you can provide!
Thanks for your help,
Corey Thompson
Hi Corey,
you may try to estimate the problem with the tip deconvolution software:http://confocal-manawatu.pbworks.com/w/page/43681258/AFM%20Deconvolution%20Software
Some of the methods include "blind" deconvolution and will give the "correct" particle shapes without calibration substrate.
To my memory, the NanoScope Analysis has the same function:http://confocal-manawatu.pbworks.com/w/page/59647324/NanoScope%20Analysisplease correct me if I am wrong.
If the particles are perfectly spherical, the height measurements would be "aberration free" at other imaging parameters (like the stiffness uniformity of the substrate) fixed and satisfy your needs.
Hope that helped,
Dimitri