Forums
Bruker Media
Community Media
Bruker AFM Probes
SPM Digest
Application Notes
NanoTheater
Website
中文
Brochures & Datasheets
Publications
Probes Catalog
Events
Manuals & Documentation
Presentations
Guide to AFM Modes
News
Journal Club
Webinars & Video
Nanovations
Other
Hi there,
We would like to use our Dimension Edge for investigating the mechanical properties of films in membranes.
Could you please tell me what is the maximum force that can be safely applied through the scan head?
(this is needed to calculate the most convenient geometry of the membranes)
Thank you very much for your help.
Regards,
Grazia
Hi Zagari,
The stiffest probes we manufacture are around 200N/m and on the Edge AFM detector arrangement these have a deflection sensitivity of around 70nm/V. I have in the past used these kind of probes with up to 10V deflection for indentation experiments. This puts you into the 150uN range. I would suggest that is a good maximum force limit.
Cheers
Ian