The Nanoscale World

mapping of various properties as a function of time

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Deepak posted on Fri, Jun 5 2015 11:52 PM

Hello friends

 

I was interested in measuring the variation in various properties (deflection, friction, current, etc) as a function of time at a particular spot on the sample surface using Nanoscope IIIa. 

What is the most  reliable way to do the above

Thanks 

Deepak 

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Verified by Deepak

Hi Deepak,

The v5 series of sofwtare do not inlcude the functionality to smeasure and store a user-selected parameter as a function of time. What you could maybe try is the following: go into the regular spectroscopy software (the one which is for exampel sued for force spectroscopy, or I-V spectroscopy). In this software, the user defines a 'ramp channel' (= parameter which will be ramped, X) and the channel which will be measured durign this ramp (Y) - X & Y refering to the XY plot which gets created and stored. If you want to measure a parameter as a function fo time, your could consider to apply a 'fake' ramp (take for example the spare Analog3 channel, and ramp it between two values you choose - select the ramp speed such that the total ramp time corresponds to the time you would like to measure the channel Y). The 'spectrum' will sho the Y channel, and you shoudl be able to open this in the Nanoscope Analysis offline software.

More recent and current software versions have more dedicated functions for this, off course.

Peter

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Top 25 Contributor
26 Posts
Points 298
Bruker Employee

Hi Deepak,

As far as I recall, the Nanoscope-IIIa (V5 series software) does not have a dedciated function to collect specific parameters as a function of time.Which software version are you running exactly?

More recent controllers (V) / software, allow one to do this in a couple of ways and at different acquisition rates ('strip-charts', HSDC,..).

Peter

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Deepak replied on Wed, Jun 10 2015 12:10 AM

Hi Peter

Thanks for the information

We are using software version 5.31 r1

 

Deepak

  • | Post Points: 12
Top 25 Contributor
26 Posts
Points 298
Bruker Employee
Verified by Deepak

Hi Deepak,

The v5 series of sofwtare do not inlcude the functionality to smeasure and store a user-selected parameter as a function of time. What you could maybe try is the following: go into the regular spectroscopy software (the one which is for exampel sued for force spectroscopy, or I-V spectroscopy). In this software, the user defines a 'ramp channel' (= parameter which will be ramped, X) and the channel which will be measured durign this ramp (Y) - X & Y refering to the XY plot which gets created and stored. If you want to measure a parameter as a function fo time, your could consider to apply a 'fake' ramp (take for example the spare Analog3 channel, and ramp it between two values you choose - select the ramp speed such that the total ramp time corresponds to the time you would like to measure the channel Y). The 'spectrum' will sho the Y channel, and you shoudl be able to open this in the Nanoscope Analysis offline software.

More recent and current software versions have more dedicated functions for this, off course.

Peter

  • | Post Points: 14
Top 75 Contributor
14 Posts
Points 162
Deepak replied on Fri, Jun 19 2015 2:03 AM

Hi Peter

Thanks for the reply. 

I would like to clarify a few points regarding the method you have recommended:

(1) I should go to the spectroscopy mode and keep the starting and ending ramp values the same. For example if I am ramping the voltage signal then starting and ending voltage value should be the same. 

(2) Thereafter I should keep the total time of the data acquisition the same as the time for which I require the output signal (for example current).

 

The above is what you are referring to as the fake ramp?

 

Deepak

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Top 75 Contributor
14 Posts
Points 162
Deepak replied on Wed, Jul 15 2015 12:24 PM

Hi Peter

 

I was able to get the value of friction as a function of time using the method of fake ramp suggested by you. thanks a lot

 

Deepak

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