Forums
Bruker Media
Community Media
Bruker AFM Probes
SPM Digest
Application Notes
NanoTheater
Website
中文
Brochures & Datasheets
Publications
Probes Catalog
Events
Manuals & Documentation
Presentations
Guide to AFM Modes
News
Journal Club
Webinars & Video
Nanovations
Other
Have your voice heard among your peers and experts in nanotechnology!
We have the pleasure to announce Seeing at the Nanoscale VIII, the eighth annual scientific conference focusing on nanostructural imaging, characterization, and modification using scanning probe microscopy (SPM) and related techniques.The event will be held from August 30th to September 1st, 2010, at the Congress Center in Basel, Switzerland, as part of the 550th anniversary celebrations of the University of Basel.
The conference is jointly organized by Veeco, the Swiss Nanoscience Institute (SNI), the Biozentrum and the Maurice E. Müller Foundation of Switzerland, and promises to build on the interdisciplinarity spanning the biological and physical sciences.
The event includes 2 ½ days of technical presentations and posters, as well as numerous opportunities to interact and collaborate with the conference organizers and participants. In conjunction with the conference, Veeco will host a half day training course covering a variety of AFM techniques.
Highlighted by the conference chairman Prof. Christoph Gerber and co-chairman Prof. Roderick Lim, Seeing at the Nanoscale VIII will provide an optimum forum for "scientists to speak to scientists" on a wide variety of nanotechnology topics with five technical sessions on:
Session I: Nanobio - Molecular Machines and Systems
Invited Speakers:
- Hermann Gaub - Ludwig-Maximilians Universität München (Germany)
- Zhifeng Shao- Shanghai Jiaotong University (China)
Session II: Nanobio - Cells and Tissues
- Alan Grodzinsky – MIT (USA)
- Michael Sheetz – Columbia University (USA) and National University of Singapore (Singapore)
Session III: Nanomaterials - Properties: electric, magnetic, chemical, thermal, optical..
- Julie MacPherson – University of Warwick (United Kingdom)
- Fraser Stoddart - Northwestern University (USA)
Session IV: Nanomechanics
- Greg Meyers – Dow Chemical (USA)
- Ernst Meyer – University of Basel (Switzerland)
Session V: Advances in SPM instrumentation: new instrument development, high resolution, combination of AFM with other technologies
- Gerhard Meyer – IBM Zürich (Switzerland)
- Markus B. Raschke - University of Washington (USA)
Quick Update:
As of today, we have received 156 abstracts for this conference!
If you have not submitted, don't miss out. The submission deadline extended to May 17th.