Forums
Bruker Media
Community Media
Bruker AFM Probes
SPM Digest
Application Notes
NanoTheater
Website
中文
Brochures & Datasheets
Publications
Probes Catalog
Events
Manuals & Documentation
Presentations
Guide to AFM Modes
News
Journal Club
Webinars & Video
Nanovations
Other
Make sure to join the Nanoscale World AFM Webinar Series Group to get all the latest updates, invitations and alerts to posted reference materials.
Join the Nanoscale World AFM Webinar Series Group Today
Browse Our Past Webinar Recorded and Reference Media
Subscribe today to our Free Learning Resource AFM Webinar e-newsletter!
After having chosen one of the webinars mentioned below you will be directed to the external GoToWebinar website www2.gotomeeting.com. A registration is necessary to participate in one of these live webinars.
Be sure to visit our AFM webinar archives to see recordings of previous broadcasts, download presentation slides and find more useful information.
Webinar
Content
23. March 2011
ScanAsyst and PeakForce Tapping
PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are imaging modes that will change the way you think about Atomic Force Microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma that less user interaction makes the AFM easier to use but creates inferior data. In this Webinar we will explain PeakForce Tapping in the framework of Contact and Tapping Mode imaging. Examples of samples imaged in air and under liquids will be given obtained on a variety of Bruker Atomic Force Microscopes.
Register Here - 8:30 AM PST
Register Here - 5:30 PM PST
April 2011
Applications in High Volume Semiconductor Manufacturing
Bruker experts will examine and explore applications in semiconductor manufacturing in this interactive webinar. Don't miss this important discussion of applications in high volume semiconductor manufacturing as part of our AFM webinar series.
Check back for Registration Information
May 2011
Survey, Screening, and Dynamics: High Speed AFM Imaging
High speed AFM imaging will be the topic for this part in our AFM webinar series. Be sure to join us as our experts present information regarding survey, screening and dynamics as they relate to high speed AFM imaging. There will be an interactive Q&A session immediately following the presentation.
June 2011
Co-Localized AFM and Raman Applications
Co-localized AFM and Raman applications will be examined in detail and discussed during an interactive Q&A session.
July 2011
TBD
Check back for more information on this webinar.
August 2011
Improvements in High Speed AFM Imaging
What are the best improvements to high speed AFM imaging? That will be the topic for this webinar and the leading edge Bruker experts will be on-hand for a full discussion of how you can take advantage of the latest improvements to high speed AFM imaging.
September 2011
Case Studies of AFM in BioMaterials
Explore actual case studies of AFM in BioMaterials with our experts. This is sure to be a very informative webinar in our series, so be sure to reserve your seat early.
October 2011
Combined Optical and SPM Microscopy
What are the advantages of combining optical and SPM microscopy for you? Find out from our experts as they guide you through the options and best practices for combining these two microscopy techniques.
November 2011
Advances and Applications in SPM Electrochemistry
The latest advances in electrochemistry using the AFM will be examined by our experts and opened to you for discussion. This looks to be another exciting addition to our important resource library for AFM applications - don't miss your opportunity to participate.
We just want to let you know that there has been a very exciting addition to this month's webinar series - specifically, the 3D Optical Profilometry and Atomic Force Microscopy for Ophthalmic Manufacturing webinar.
This webinar will be presented by Andrew Masters, VP of Strategic Marketing & Business Development, and should prove to be very informative.
Look for more information about our July broadcast coming soon! And don't forget to join our Nanoscale World Community Webinar Group to get all the latest schedule updates and invitations as well as access, download, reference and view recorded media from previous webinars - whenever and wherever you want.
OVERVIEW
The structural properties of food directly affect the appearance, texture, taste and overall quality of the product. Atomic force microscopy is the only technique that allows nanoscale investigation of these important food properties. During this webinar, you will learn how AFM can be used to image food products and how quantitative structural information can be extracted from such studies.
PRESENTER
Alexandre Berquand, Ph.D., Bio Apps, Veeco Instruments, Inc.
The solar energy industry has experienced dynamic growth over the last several years, due in part to factors such as high oil prices, government energy initiatives, and a growing worldwide awareness of the potential impact of greenhouse gas emissions and associated carbon footprints on the environment.
Multiple photovoltaic (PV) technologies are presently competing for share of this growing market from traditional "bulk" crystalline silicon, through thin-film technologies including amorphous silicon, Cadmium Telluride CdTe and CuInGa(Se)2, or CIGS.
As with any industry, the key driver for commercial success is the overall cost to the end user, be it residential installations or grid-connected, utility-scale systems. While there are advantages and disadvantages to each of these technologies solar cell manufacturers are united in the goal to decrease the cost per kilowatt-hour for electricity over the life of the system. This cost can only go down if solar cell technologies continue to evolve.
Accurate 3D surface metrology of key features is a critical component to increasing solar cell efficiencies and improving yield, thereby decreasing manufacturing costs.
Andrew Masters, Vice President, Strategic Marketing & Business Development, Veeco Instruments, Inc.
PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by Bruker. They are AFM imaging modes that will change the way you think about atomic force microscopy. While PeakForce Tapping adds a low interaction, direct force control imaging mode to the tool chest available to the nanotechnologist, ScanAsyst breaks the dogma that less user interaction makes the AFM easier to use but creates inferior data. In this Webinar we will explain PeakForce Tapping in the framework of Contact and Tapping Mode imaging. Examples of samples imaged in air and under liquids will be given obtained on a variety of Bruker Atomic Force Microscopes.
Dr. Stefan Kaemmer