Veeco talk at Microscience 2010 / UK SPM 2010

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Posted: Fri, May 7 2010 6:37 AM

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We are pleased to let you know that the below abstract by Veeco's R&D team has been accepted for a talk at the Microscience / UK-SPM 2010 meeting in London.

Real time interaction force analysis enables quantitative nanomechanical imaging

Johannes H Kindt, Chanmin Q Su, Shuiqing Hu, Bede Pittenger

 Abstract

Since its introduction two decades ago, the Atomic Force Microscope (AFM) has held the promise of combining nanometer resolution imaging with localized mechanical property measurements. In practice, the speed of mechanical measurements via force-extension curves has generally led to a level of division between these two modes of operation - on the one hand imaging, with some mechanical property contrast (e.g. phase), on the other hand, measurements of mechanical interaction, with some level of mapping capability (force mapping). Recent advances in real time processing of the interaction force have enabled a full integration of imaging and force measurements. As a consequence, all information contained in the force curve can be utilized during imaging: As a quantitative mechanical image channel (stiffness, modulus, adhesion, or dissipation), and also, to simplify AFM operation itself. By monitoring the intermittent probe-sample interaction force directly, issues associated with probe dynamics, such as drive frequency selection, and free amplitude variations during engage, can be excluded from AFM operation.

Functional principle, performance with regard to "classical" AFM modes, and a range of applications will be discussed.