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Metrology Conferences in Europe 2010

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Not Answered This post has 0 verified answers | 2 Replies | 1 Follower

Top 50 Contributor
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Robert Melzer posted on Mon, Jul 12 2010 4:29 AM

Hi all,

I do have a customer who wants to publish a paper qualification of SWR and LER on waveguides using conventional AFM (Tapping), Veecos CD Mode and CD SEM technique. Where can they do that within Europe in 2010? Are there other ones than SPIE?

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Bruker Employee
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SeanHand replied on Mon, Jul 12 2010 1:03 PM

Hi Robert -

    Here are some ideas on where to look for opportunities to present:

http://www.metromeet.org/en/

http://spie.org/microtechnologies-new-millennium.xml

http://www.semiconeuropa.org/ProgramsandEvents/index.htm?parent=yes&parentId=144

-Sean

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Top 50 Contributor
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Robert Melzer replied on Thu, Jul 15 2010 11:45 AM

I found some more, just in case somebody is interested as well

http://surfacemetrology.org/

http://www.nist.gov/eeel/semiconductor/conference/

 

This might be handy as well

http://www.conference-service.com/conferences/nanotechnology.html

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