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Hello,
I was looking for technical information about how can I construct IV curves after afm caracterization of samples. I really appreciate your comments.
thank you.
Mary Cruz
Mary, please tell me what version of NanoScope you are using.
Thanks, Mike
Alternatively you could just send me a nanoscope data file from one of your captured ramps. My email address is mmaybrun@veeco.com. Regards, Mike
Hi Mary,
You can measure I/V curves by applying a voltage between your tip and sample and measuring the current flow. The voltage is typically applied to the sample, the "V-signal" and a suitable I/V converter connects to the tip. That I/V converter pulls the input signal to (virtual) ground and amplifies it so that a sensible output signal can be achieved. The output signal of the I/V converter is used as an input signal: the " I signal". Measurements are typically carried out in contact mode, current ranges are typically micro-Amp to pico-Amp. What components do you need?
1. A good AFM
2. A suitable I/V converter with wiring
3. Conductive tips.
4. Software for ramping the bias voltage and displaying the current signal.
In addition to point measurements, i.e. local I/V curves, you can of course also image at a given bias voltage. Thus a good closed-loop AFM, e.g. Icon, Edge, Innova, is very beneficial as it allows you to precisely adress certain locations whithin your image to carry out the I/V measurement.
Stefan
Hi Stefan, thank you very much for your answer, it is very hepful for me.
regards,