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We have Veeco Multimode AFM with CAFM application module/current sensor/connecting D15 wires. We do not have any application note or a pictorial setup description of this application module. The Nanoscope IIIA communicates with the microscope through Quadrex extender, but the software does not show the CAFM MASTER in the “microscope profile”.
Could you kindly help in setting up the microscope in CAFM and KPFM modes? What are the hardware and software necessary to set this up?We look forward to your support and cooperation.
Mithun,
I checked with Mark and Alan in Support and they said you were in contact with them and now in good shape. . .
Keep us posted,Steve
We are stuck again. Could you please check with Mark and Alan to see how it can be resolved.
Thanks.
Mithun
Hi Stephen,
I'm also trying to set up C-AFM on my Dimension 3100/NanoScope IIIa. Is there someone I can get a hold of to upgrade my current tool from DAFM to DAFMCL. I think it's just a module upgrade, but I'd like to confirm. Also, if there's a fee based lab part of Bruker that can also do a Scanning Capacitance Measurement for us, that'll be good too. Whichever can come first. If the technique proves to be useful, we'd like to work on the upgrade.
Thanks,
Christina
Christina Monis asked about getting SCM analysis service. My company, Advanced Surface Microscopy ("ASM"), can do SCM measurements on a fee-for-service basis.
ASM is an independent analytical testing / contract research lab specializing in AFM and related techniques since 1990. We are equipped with a full range of electrical application modules, including SCM, CAFM, SSRM, and TUNA.. Please contact us offline at info@asmicro.com to discuss your requirements.
The short answer to the question about setting up C-AFM on a Dimension 3100/NanoScope IIIa is:-changing from DAFM to DAFMCL won't get you there-getting there is more than just a module upgrade.Please contact us offline for more details and to see how we can help you get there.
As a courtesy to us, and to save your time, please include your contact info when you email us.
Don Chernoff, Ph.D., PresidentAdvanced Surface Microscopy, Inc.; 3250 N. Post Rd., Suite 120;Indianapolis IN 46226 USA E-Mail: donc@asmicro.com www.asmicro.com Voice: 317-895-5630 Toll free: 800-374-8557 (in USA & Canada)Fax: 317-895-5652[business activities since 1990: analytical services in AFM, AFM probes, consulting, training, calibration and test specimens, calibration and measurement software, used NanoScope equipment.]