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I am using a Dimension 3100 AFM system to perform some conducting AFM scans on a sample with alternating strips of gold and SiO2. To apply a bias on the tip can I use the standard probe holder or would I need to use a EFM probe holder? Can you point me to any useful manuals that talk about the hardware & software setup to take EFM images.
Thanks,
Ashish
Hi Ashish,
In conductive AFM/TUNA the bias voltage is applied ot the sample. The tip is pulled to (virtual) ground by the transimpedence amp acting as the I/V converter. If you contact bruker AFM tech support they can mail you the manuals for the 3100.
Best,
Stefan
On the interleave options, I see an option to apply a bias voltage on tip through analog 2. Are you saying this will not work?
Thanks for the reply,
Probably not.
I think I might have used the wrong term. I would like to put a bias on the tip and map the phase shift due to electric forces at a lift height ( EFM). Can I do this with a standart DI3100 system?
Absolutely. You want to use LiftMode for the "EFM" scan. If you have a NSV controller you may also be interested in this applications note: http://nanoscaleworld.bruker-axs.com/nanoscaleworld/media/p/687.aspx