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Do you know anything about surface parameter calculations or know somebody at Bruker who does? I know how to calculate 2-D/3-D Ra and RMS Roughness for an AFM, Optical Profiler, Contact Profiler, etc, but I was wondering if you could provide me with an equation for waviness. All the references I’ve read state waviness more as a concept, but they never give the actual equation…
Thanks.
We don’t have waviness in our analysis package so I am not completely sure, but a quick survey of the web seems to indicate waviness is the measure of absolute deviation of a surface at frequencies below what is considered roughness. By this definition, there is not an equation per-se because it is just a peak to peak measurement. Likewise, as you point out, the definition is not particularly rigorous because the cutoff frequency (between roughness and waviness) is arbitrary and depends on the measurer.