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The Dimension FastScan™ Atomic Force Microscope (AFM) delivers,for the first time, extreme imaging speed without loss ofresolution, loss of force control, added complexity,or additional operating costs
Atomic Force Microscopy Webinar Series
High Speed AFM Imaging:
Survey, Screening, and Dynamics with Bruker's Revolutionary Dimension FastScan Atomic Force Microscope
Webinar Dates & Times
Tuesday, May 24, 2011
Evening Broadcast, 11:30 PM PST*
Wednesday, May 25, 2011
Morning Broadcast, 8:30 AM PST*
Webinar Overview
Atomic Force Microscopy has long been somewhat constrained to applications where its unique information and flexibility outweigh its limited imaging bandwidth. Academic efforts to increase the speed of atomic force microscopes (AFMs), while exciting, were generally tightly focused at time resolving nanoscale processes, and were achieved in part by sacrificing.... Read More
Each broadcast will include a fully-interactive Q&A sessions to answer all your questions and share your ideas. There will be 2 worldwide broadcasts — register early to reserve your seat.
Presentation Topics
• Brief historical overview of High Speed AFM
• Speed and productivity – What is needed in a fast AFM?
• FastScan technology – step-by-step
• Proof of performance - Same quality, same force control, same operating cost — Faster
• Dimension FastScan™ AFM Applications in Survey, Screening and Dynamics
Register To Participate In Live Broadcast
The Atomic Force Microscopy Webinar Series
An Open and Free Resource for Atomic Force Microscope Owners and Users
Watch Our AFM Videos On YouTube
Bruker Nano Surfaces YouTube Channel
Sincerely,
Your AFM Webinar Team
*All times given are for PST (Pacific Standard Time, USA & Canada). Be sure to check your local times when registering.
Bruker Nano Surfaces Division — AFM Business
112 Robin Hill Road
Santa Barbara, CA 93117, USA
Tel. +1 (805)967-1400
Fax +1 (805)967-7717
productinfo@bruker-nano.com
www.bruker-axs.com
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