Advanced Scanning Probe Microscopies at the CNMS, 9/21-22, Oak Ridge, TN

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Stephen Minne Posted: Thu, Jun 23 2011 5:10 PM

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CNMS_SPM_Workshop2011_Planv8a.pdf

Center for Nanophase Materials Sciences Workshop
Advanced Scanning Probe Microscopies at the CNMS: Materials
Structure and Function from Atomic to Micron Scales

September 21-22, 2011

The Center for Nanophase Materials Sciences
Oak Ridge National Laboratory, Oak Ridge, TN USA
Center for Nanophase Materials Sciences Workshop
Advanced Scanning Probe Microscopies at the CNMS: Materials
Structure and Function from Atomic to Micron Scales

Organizers:
Arthur P. Baddorf (ORNL)
Sergei V. Kalinin (ORNL)

Invited Lecturers:
S. Jesse, A. Tselev, A.P. Li, P. Maksymovych, N. Balke, Z. Gai, M. Pan - ORNL

Development of nanoscience and nanotechnology requires the capability to image,
manipulate, and control matter and energy on the nanometer, molecular, and ultimately,
atomic levels. Scanning probe microscopy (SPM) techniques provide unparalleled access to
the nanoscale world through structural, functional, and chemical imaging and manipulation on
nanometer and atomic scales. Beyond imaging surface topography, SPMs have found an
extremely broad range of applications for probing electronic, transport, optical, magnetic,
mechanical, and electromechanical properties – often at the level of several tens of
nanometers and below. Achieving full potential of SPM requires focused effort on developing
novel SPM platforms and imaging modes, data interpretation routines, as well as capabilities
for the in-situ sample preparation.
This workshop features presentations by CNMS staff members and SPM industry
focused on technical capabilities developed and/or available at CNMS. These include:
• Atomic and vibrational imaging by low-temperature high magnetic field STM
• Transport characterization by 4-probe STM/SEM
• Scanning Electron Microscopy with Polarization Analysis
• Piezoresponse Force Microscopy and Spectroscopy
• Band Excitation SPMs for thermal, magnetic, and mechanical property mapping
• Electrochemical Strain Microscopy of Li-ion and oxygen conductors
• Microwave imaging and spectroscopy
This workshop will also feature presentation by leading SPM vendors devoted to the
latest advances in SPM modes. Ultimately, we aim to build a network of advanced SPM
practitioners to promote rapid dissemination of theoretical knowledge, experimental protocols,
and novel technique development in these rapidly growing areas.
For more information and registration, please check regularly the CNMS web site at
www.cnms.ornl.gov or contact the organizers at sergei2@ornl.gov or baddorfap@ornl.gov.