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Enabling AFM Advancement

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Tracy Krainer Posted: Thu, Apr 4 2013 4:12 PM

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Innovation with Integrity

Enabling AFM Advancement

April 2013

David Rossi
Executive Vice President
and General Manager Bruker's AFM Business

Topographic map of graphene flake prepared on silicon dioxide, reveals expected 300pm graphene step between successive layers.

In the discipline of Tip-Enhanced Raman Spectroscopy (TERS), we continue to introduce state-of-the art capability. For IRIS customers, we are now offering proprietary high-contrast TERS probes that are guaranteed to provide enhancement factors greater than 10, direct out of the box. Alone, a TERS capable AFM is only half of the solution; with these probes the IRIS AFM-Raman systems are the only completely integrated commercial TERS solutions that guarantee TERS performance.

To address nanoelectrical characterization needs in the semiconductor industry, we have released the Dimension Icon® SSRM-HR . We have further optimized the performance of the Dimension Icon in conjunction with the SSRM electrical module and environmental control to provide the highest spatial resolution and the most accurate solution for carrier profiling.

In graphene research, Bruker's PeakForceQNM®is being used for applications ranging from unraveling graphene layering and to quantifying the graphene-metal interaction. This latter work ultimately seeks to control electrode bonding variability in device applications. While this work is still preliminary, it has important implications for in creating a new generation of graphene based electronic devices: http://dx.doi.org/10.1021/nn305608a.

In life sciences, with its unsurpassed speed and resolution capabilities, our Dimension FastScan Bio™ is enabling new research possibilities in biological dynamics. You can see some of its capabilities in stem cell research and antimicrobial activity on live E. Coli cells on our website videos (click here), or visit us at AFM BioMed this May in Shanghai, where Bruker scientists will be presenting the next generation of these experiments.

Our highly successful Seeing at the NanoScale event has been growing year after year. This year, to make it more accessible to a greater number of researchers, we are holding several Seeing at the NanoScale conferences regionally. We did this to answer the needs of our customers and attendees that found a single event and destination was not always the best way to keep up with community and Bruker advances. The first conference is right around the corner, in April, at Northwestern University. Registration is open, and I hope I get the opportunity to see you there. We are also partnering with 10th International Workshop on Nanomechanical Sensing held May 1-3, at Stanford University.

This promises to be an eventful and exciting year. I hope that you too are off to a great start to 2013, and all of us here at Bruker look forward to working with you soon.

Filed under: AFM, SSRM, FastScan Bio, TERS probes
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Enabling AFM Advancement

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