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Announcing two AFM short courses to be offered by Dalia Yablon and Greg Haugstad in the spring at trade association meetings:1) Pittcon, March 2014, Chicago, "Atomic Force Microscopy, a Toolkit for Nanotechnology Characterization: Overview, Best Practices and Industrial Applications"http://ca.pittcon.org/Technical+Program/tpabstra14.nsf/SCoursesByCat/86466F45AB16906285257B98006A7A37?opendocument2) ACS, March 2014, Dallas, "Understanding and Utilizing AFM: From Basic Modes to Advanced Applications".http://proed.acs.org/course-catalog/courses/UAFM/