Icon Dimension-nanoscope V controller-Signal Access Module (SAM V)

Vsantiso posted on Wed, Aug 13 2014 11:08 AM

rated by 0 users

Hi all,

Recently I started to work with the Icon dimension and I have a couple of questions...

Would be it possible to extract/measure the voltage bias applied to the tip (for example during a KPFM experiment) through the nanoscope controller to an external equipment? How could I do it? I found different output data but no tip bias...

If the first option was not possible, woulb be it possible to do the same but using a Signal Access Module (SAM V)? The question is again, how could I do it? Where can I get some updated manual that indicates how to connect the SAM??

Thanks in advance