SPM Course--time is running out to register

DigestMigrator posted on Fri, May 21 2010 1:10 PM

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Scanning Probe Microscopy:  From Fundamentals to Advanced Applications

is a week long course featuring the concepts, instrumentation, and applications of Scanning Probe Microscopy. The course runs at Lehigh University from June 14-17, as part of the Lehigh Microscopy School which is celebrating its 40^th year.

The course includes lectures from instructors with over 80 years of combined SPM expertise, along with nearly equal time in small groups for hands-on experience with equipment graciously provided by Agilent Technologies, Asylum Research, NT-MDT, and Veeco. Participants will therefore learn the theory, AND the practical knowledge, to utilize the full potential of SPM systems for basic to advanced applications in the physical and biological sciences and engineering.

For more information or to register, please contact the program coordinator:

Sharon Coe (610-758-5133)

Sharon.coe@lehigh.edu

www.lehigh.edu/microscopy/courses/spm.html

OR, be in touch with an instructor:

Nancy Burnham (Worcester Polytechnic Institute)

Bryan Huey (University of Connecticut)

Bruce Koel (Lehigh University)

Dmitri Vezenov (Lehigh University)

Richard Vinci (Lehigh University)

-Bryan Huey

University of Connecticut

www.ims.uconn.edu/~bhuey