April 2011, Issue 1

Congratulations to Our 2011 SPM Calendar Image Winners

We would like to thank everyone for their interest and image entries – And a special congratulations to Michael Bolen, Purdue University, IN, USA. His 4H-SiC surface image was selected for the cover. Winning Images

Updated Webinars

To see our latest webinars as well as a complete library click here

Bruker's new PeakForce TUNA™ module enables very high-resolution nanoelectrical characterization on fragile samples, including organic photovoltaics, lithium ion battery composites, and carbon nanotube–based device structures. More

AFM Environmental Control 1-ppm Turnkey Solutions

2011 Probes and Accessories Catalog Now Available

A catalog and a valuable resource guide - Bruker's 2011 Probes and Accessories Catalog is now available. As a catalog it includes extensive information on all probes and accessories products currently available from Bruker AFM Probes. As a resource it provides tools such as a probes selector guide, product information on Bruker AFMs, and an educational section covering the most widely used AFM modes and their related probes. Desktop version includes hyperlinks to relevant pages.

Click here to download or to order hard copy

Topic:
Atomic Force Microscopy-Based Screening of Drug-Excipient Miscibility and Stability of Solid Dispersions

The article describes a novel assay (test) for the compatibility of active pharmaceutical ingredient (API) and excipient in an amorphous formulation. More

Dimension Icon: A User's View

Customer Service

Service Spares:
As overall instrument sales continue to rise we want to ensure our ability to provide exceptional support for new products as well as current customers. We have invested in service spares expanded our service stock by 2x, including an even greater increase in our regional stocking hubs to enable faster instrument recovery should a failure occur.

Service Programs:
We recognize the need for cost effective, high value service programs and have released a new set of programs that cover the range from preventative maintenance to full extended warranty – at price points that should enable each customer the benefits of a service program. Learn more

First 3 Invited Speaker Topics:

Prof. Paul Weiss, UCLA
Designing, Measuring, and Controlling Molecular and Supramolecular Devices

Prof. Daniel Müller, ETH
Multifunctional High-Resolution AFM Imaging of Native Proteins

Dr. Robert Cook, NIST
Future Directions for Nanoscale Characterization: Absolute Nanomechanical Properties

More Invited Speaker Topics

Call for Papers Deadline: April 8 – Submit Now!

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Nanovations is a quarterly newsletter from Bruker Nano Surfaces Division. We welcome your feedback and encourage you to share your ideas for topics you would like us to cover in future issues. Please send your comments or suggestions to Steve Hopkins, Marketing Communications Supervisor.