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AFM Systems & Solutions
Bruker AFM Probes
I would like to bring to your attention a symposium at the upcoming fall ACS meeting in Philadelphia, PA August 19-23rd 2012 on
“Advances in Methods and Applications of Scanning Probe Microscopy to Polymer Materials” co-hosted by the Division of Polymer Chemistry and Division of Colloid and Surface Science.
Abstracts should be submitted on-line on the PACS abstract submission site: http://abstracts.acs.org. Click on POLY, select this symposium topic and follow instructions to submit an abstract with 150 or less words. Deadline for abstract submission is March 19th.
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Symposium Description:. This symposium will focus on recent research progress in both developing new SPM based methods for and novel applications of SPM methods to polymer materials. The focus of developing these new methods and utilizing these applications should be to understand mechanical, rheological, thermal, electrical, and self-assembly behavior of polymers on the nanoscale and to establish composition-processing-morphology-performance relationships of polymers, polymer blends, and composites. All SPM based methods will be considered, including traditional mechanical (phase, nanoindentation), thermal, and electrical based methods as well as more recently developed methods from single to multifrequency measurements and high speed AFM. All experimental and theoretical aspects of SPM methods developed with specific relevance to polymer materials or application of such methods to polymer materials will be covered. Application of SPM to a wide variety of polymer materials is to be covered including amorphous and semicrystalline polymers, polymer nanocomposites, block copolymers, polymer compounds, elastomers and rubbers, impact copolymers or toughened polymers, conductive polymers, single polymer chains, etc. Of particular interest is interpretation of AFM measurements that can be related to meaningful and relevant polymer material properties.
Confirmed Invited Speakers Include:
Robert Carpick, University of Pennsylvania Steve Minne, Bruker Nano Systems
Yifu Ding, University of Colorado Sergei Magonov, NT-MDT
Liang Fang, Arkema Ken Nakajima, Tohoku University
Greg Haugstad, University of Minnesota Rene Overney, University of Washington
Jamie Hobbs, University of Sheffield Roger Proksch, Asylum Research
Donna Hurley, NIST Arvind Raman, Purdue University
Kevin Kjoller, Anasys Vladimir Tsukruk, Georgia Inst. of Tech
Mark Van Landingham, Army Research Lab Gil Walker, University of Toronto
Robert Magerle, Technical University of Chemnitz