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  • Re: Thin film Hardness by PDNISP

    Hi Ranna, With AFM, hardness is usually evaluated based on the residual indentation left after the indent. It is usually defined as Hardness=Maximum load/projected area of the pit left by the indent. The Maximum load is just your ramp mode trigger (assuming you are using relative triggering and you have...
    Posted to SPM Digest (Forum) by Bede Pittenger on Tue, Jul 24 2012
  • New NanoScope Analysis release, now with new force curve analysis tools! (v1.40R2)

    I'm happy to announce the latest version of NanoScope Analysis, version 1.40R2. For anyone not already familiar with it, NanoScope Analysis is a free software package for analyzing data collected using Bruker SPMs. This latest version includes a number of new features for force curve analysis: •...
    Posted to SPM Digest (Forum) by Ben Ohler on Fri, Mar 30 2012
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