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  • Re: Sample roughness and appropriate probe...

    Dear Mariam, How stiff (ballpark) is your ceramic sample? When you say the roughness is 0.5-2um what is the scan size that gives you that roughness? If you want to measure the modulus of a stiff sample, you must use a stiff cantilever. Question 1 will allow you to look in the manual and find the recommended...
    Posted to SPM Digest (Forum) by Bede Pittenger on Wed, Jun 12 2013
  • Re: Cantilever selection for measuring adhesion force

    You should choose a cantilever that is sensitive as possible, but does not cause the deflection measurement to saturate or become non-linear. The force is the spring constant times the deflection sensitivity times the detector voltage (F=K*Sd*V). If we know K for a given probe type and we know the approximate...
    Posted to SPM Digest (Forum) by Bede Pittenger on Mon, Jun 10 2013
  • Re: Do the tips ´OTESPA´ have the Al coating on the front side?

    No, there is no tip coating on OTESPA probes. The Al coating is backside only for better reflectivity. MESP or SCM-PIT probes are commonly used for KPFM. If you like the visible apex tip feature of the OTESPA probes, then you might also check out the OSCM-PT probes. Details for each can be found at Bruker...
    Posted to SPM Digest (Forum) by Ben Ohler on Thu, Jul 5 2012
  • Re: Surface Potential and Probes

    Hi Mithun, Having the EFM HOLDER AND SCM-PIT tips are enough for you to perform surface potential on Multimode; you do not need to apply voltage externally. Surface potential measurement has been done on organic solar cell (BHJ) and its component materials; make sure you electrically connect the underlying...
    Posted to SPM Digest (Forum) by Chunzeng Li on Wed, Jun 29 2011
  • Re: Surface Potential and Probes

    Hi Sheila, The probe is critical for surface potential measurements, it is required to have a well defined work function and be robust. SCM-PIT probe from Bruker has a Pt-Ir coating which meets these criteria. Also Rocky Mountain Nanotech offers solid Pt probes (25Pt300B) which has the advantage that...
    Posted to SPM Digest (Forum) by Chunzeng Li on Thu, Jun 2 2011
  • Re: Probe selection in Force Volume/Contact Mode

    SNL-10 probes should work fine for imaging photoresist in contact mode or for doing adhesion maps in force volume mode. It is likely that the photoresist is too stiff to get good elasticity information with those probes, however. You should give it a try, but I suspect you will not have much deformation...
    Posted to SPM Digest (Forum) by Bede Pittenger on Fri, Aug 20 2010
  • Re: High aspect ratio surface photo resist

    Good Evening Harry - Our FIB probes are conical with a very sharp end radius similar to that of a TESP. The specification on these probes is based on the width of the spike at a defined height up from the probe apex. In your case, the FIB1-100 is 100nm wide 1 um up from the probe apex, as another example...
    Posted to SPM Digest (Forum) by SeanHand on Wed, Jul 21 2010
  • Re: ScanAsyst with other probes

    Tony, I don’t think you should have any problem using these probes, and the operation should not change. A key feature of ScanAsyst is its exceptional force control when compared to other modes, and we have found that this force control enables much higher resolution when imaging because tip sharpness...
    Posted to SPM Digest (Forum) by Stephen Minne on Fri, Jun 18 2010
  • Re: Mechanical measurements on hard materials

    Hello Gerard and Peter - I have used a Veeco Probes (https://www.veecoprobes.com/) FESP substrate and lever onto which was glued a pyramidal diamond probe from Micro Star (http://www.microstartech.com/) for imaging surface roughness between very tall (80 um) posts (the diamond pyramids were ~100um tall...
    Posted to SPM Digest (Forum) by SeanHand on Sun, May 23 2010
  • Carbon Nanotube Probes (CNP) for high resolution imaging

    I am using carbon nanotube AFM probe for high resolution AFM imaging of inorganic thin film material. But the carbon nanutube AFM probe is apt to break while approaching the sample surface before the imaging process begin. May be the carbon nanotube AFM probe is fragile comparing with silicon/SiN AFM...
    Posted to SPM Digest (Forum) by BrukerApplications on Tue, May 4 2010
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