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  • Re: SWR Analysis

    Hi Robert - For SWR analysis, a plane is fitted to and then extracted from the sidewall. All of the data points are used, there is no interpolation. You can compensate for drift by using either a 2nd or 3rd order planefit. When using a higher order planefit though, you want to make sure that you are...
    Posted to SPM Digest (Forum) by SeanHand on Tue, Jun 22 2010
  • Re: Help on surface roughness

    Hi Linda, For your application and in general, it is important to get a good understanding of what the Flatten and Planefilt routines do to the data and how this will effect your results. They are different routines, but as you have experienced there is some similarity between the effect on the image...
    Posted to SPM Digest (Forum) by John Thornton on Mon, May 24 2010
  • Measuring noise

    Can someone describe, or better still, give a reference to a standard method for determining noise levels in AFMs? In particular, I'm interested in a method applicable to compare noise levels across different microscopes, so it should not be dependent on a particular scope's software.
    Posted to SPM Digest (Forum) by Anonymous on Thu, Jan 7 2010
  • roughness question

    Can anyone clearly explain to me the value of RMS? Why would I want to give someone Root Mean Square data vs. Roughness Average or surface area data? Any help on this would be most appreciated.
    Posted to SPM Digest (Forum) by Anonymous on Thu, Jan 7 2010
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