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  • April 2013, Issue 1

    Innovation with Integrity Having touble viewing this email? Click here to view in your browser. Atomic Force Microscopy David Rossi Executive Vice President and General Manager Bruker's AFM Business Enabling AFM Advancement Bruker has always been committed to partnering with our customers to meet...
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
  • Re: Why the current noise increases dramatically when tip touches the sample?

    Hi Solong, The noise level of the module is best charicterized when the tip is off the surface. But anyway, the noise should not go up to 500 pA; is it really noise or signal. can you send me a screenshot or the original file for me to take a close look? Thanks Chunzeng Li Applicaiton Scientist Nano...
    Posted to SPM Digest (Forum) by Chunzeng Li on Fri, Jul 27 2012
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