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  • April 2013, Issue 1

    Innovation with Integrity Having touble viewing this email? Click here to view in your browser. Atomic Force Microscopy David Rossi Executive Vice President and General Manager Bruker's AFM Business Enabling AFM Advancement Bruker has always been committed to partnering with our customers to meet...
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
  • Re: Why the current noise increases dramatically when tip touches the sample?

    Hi Solong, The noise level of the module is best charicterized when the tip is off the surface. But anyway, the noise should not go up to 500 pA; is it really noise or signal. can you send me a screenshot or the original file for me to take a close look? Thanks Chunzeng Li Applicaiton Scientist Nano...
    Posted to SPM Digest (Forum) by Chunzeng Li on Fri, Jul 27 2012
  • Re: CAFM

    If possible I use silver epoxi or similar, indium works too to achieve proper conductivity from sample to metal puck. If already mounted with tape you may try to paint some silver over the edges. The Innova has a slight offset in the Bias voltage so 0V may not be 0V. You may want to measure that in order...
    Posted to SPM Digest (Forum) by Anonymous on Tue, Oct 18 2011
  • Re: Direction of current in C-AFM

    The C-AFM polarity convention with Multimode is: positive current means the current is flowing from the sample to the tip. Another way to say this is: if you use a positive sample bias, you would read a posistive current. When you say there is "no" bias applied, ideally that means 0 V. But...
    Posted to SPM Digest (Forum) by Chunzeng Li on Thu, Mar 3 2011
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