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Innovation with Integrity Seeing at the Nanoscale Is Coming to a Venue Near You April 2013 After over a decade of extremely popular once-a-year conferences, Seeing at the Nanoscale is expanding to multiple locations in 2013. The year-on-year growing participation, interest, and valued interactions were...
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Seeing at the Nanoscale 2013 with Nuance Don’t miss this opportunity to meet your peers, discover next-generation nanotechnology, and be the first to hear about the exciting trends and industry updates. This year’s conference features an incredible mix of visionaries—all ready to give...
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October 2011, Issue 03 Product Innovations - Industry Leaders are Talking Dimension FastScan The Dimension FastScan improves imaging speed without sacrificing nanoscale resolution, enabling users to work hundreds of times faster than is possible with other commercial AFM systems and delivering results...
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The Dimension FastScan ™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs Atomic Force Microscopy Webinar Series High Speed AFM Imaging: Bruker Dimension FastScan...
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Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible...
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BILLERICA, Mass., Oct 07, 2010 (BUSINESS WIRE) -- Bruker Corporation (NASDAQ: BRKR) today announced the closing of its acquisition of the Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments businesses from Veeco Instruments, Inc. (NASDAQ: VECO) for $229.4 million in cash...