|
Raman and TERS Application Note
Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced...
|
Mon, Feb 25 2013
|
116
|
0
|
|
Dimension Edge Chinese Manual
Bruker Dimension Edge SPM 中文操作 简要说明 对应软件版本 nanodrive
|
Tue, Dec 18 2012
|
48
|
0
|
|
High Resolution Quantitative Kelvin Probe Force Microscopy...
Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work...
|
Fri, Oct 12 2012
|
148
|
0
|
|
PeakForce KPFM
Combines Bruker's unique PeakForce Tapping technology with FM KPFM detection to enable quantitative...
|
Thu, Oct 4 2012
|
88
|
0
|
|
Photoconductive AFM Accessory for Icon
Enabling characterization of organic photovoltaics by photoconductive AFM. Leverages Dimension Icon...
|
Thu, Oct 4 2012
|
35
|
0
|
|
AFM-Raman and TERS - Webinar Slides
Correlated Imaging & Latest TERS Advances
|
Thu, Oct 4 2012
|
83
|
0
|
|
Dimension Icon Chinese Manual
|
Fri, Aug 3 2012
|
61
|
0
|
|
ECAFM Research Solution
Bruker’s closed electrochemical cells enable a wide range of new electrochemical atomic force...
|
Tue, May 15 2012
|
49
|
0
|
|
The Innova-IRIS AFM-Raman system from Bruker
|
Tue, Feb 28 2012
|
47
|
2
|
|
Transition Temperature Microscopy - Webinar Slides
|
Wed, Feb 15 2012
|
33
|
2
|
|
AFM meets Raman Spectroscopy - Webinar Slides
|
Thu, Dec 22 2011
|
62
|
0
|
|
TERS System for Material Science
Innova-IRIS AFM-Raman Research Platform.
|
Tue, Nov 22 2011
|
63
|
0
|
|
Innova
Latest brochure about our Innova research AFM platform. Updated to reflect latest v8 user interface...
|
Tue, Nov 22 2011
|
43
|
0
|
|
Dimension Icon AFM-Raman
Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond...
|
Mon, Oct 24 2011
|
60
|
0
|
|
Advances in Combined Atomic Force and Raman Microscopy
Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about...
|
Mon, Oct 24 2011
|
158
|
0
|
|
High Speed Imaging while Heating and Cooling
Dynamic heating and cooling AFM measurements can be challenging because the temperature changes...
|
Fri, Oct 7 2011
|
20
|
1
|
|
AFM & Optical Microscopy
This datasheet describes the NEOS – a high resolution surface inspection microscope. NEOS...
|
Mon, Sep 19 2011
|
42
|
0
|
|
Bacteriorhodopsin imaging with Bruker Dimension FastScan...
See this new paper on ultrahigh resolution imaging and mechanical mapping of bacteriorhodopsin....
|
Tue, Sep 13 2011
|
14
|
0
|
|
Quantitative Imaging of Living Biological Samples PeakForceQNM...
It is now well established that measuring ex vivo the mechanical properties of living cells can...
|
Wed, Sep 7 2011
|
180
|
0
|
|
Turnkey 1ppm Environmental Control AFM Systems
2-page datasheet showcasing Bruker's new turnkey AFM system configurations for environmental...
|
Wed, Aug 24 2011
|
18
|
0
|