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Webinar Video - Pharmaceutical Applications of the Atomic...
The Atomic Force Microscopy Webinar Series: Pharmaceutical Applications of the Atomic Force Microscope...
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Fri, Jun 4 2010
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81
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0
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Chemical Compatibility List
This table is a compilation of chemical compatibilities of a quite comprehensive list of chemicals...
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Fri, Jun 4 2010
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86
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0
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Multiple Force Curves Without Scanning
This document describes how to use the Point and Shoot function to measure multiple force curves...
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Fri, Jun 4 2010
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237
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0
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Webinar Video - 3D Optical Surface Profilometry and AFM...
A Special, Cross-Platform, 3D Optical Surface Profilometry and Atomic Force Microscopy Webinar:...
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Tue, Jun 22 2010
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55
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0
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Webinar Video - AFM: Characterizing Biomaterials at the...
AFM Webinar Series: Atomic Force Microscopy: Characterizing Biomaterials at the Nanoscale OVERVIEW...
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Tue, Jun 22 2010
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178
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HarmoniXTM Microscopy for Materials Characterization
By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy...
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Tue, Jul 6 2010
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79
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Webinar PDF Slides - ScanAsyst and PeakForce Tapping
PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by...
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Thu, Mar 24 2011
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120
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1
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Webinar Video - ScanAsyst and PeakForce Tapping
PeakForce Tapping™ and ScanAsyst™ are two exciting new products recently released by...
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Thu, Mar 24 2011
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145
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0
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Example 2: Anodic Oxidation on Silicon - From NanoMan VS...
Example 2: Anodic Oxidation on Silicon Anodic oxidation in NanoMan works well when using the TAPPING...
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Fri, Apr 8 2011
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56
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0
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SINGLE-WALLED CARBON NANOTUBE PROBES FOR AFM IMAGING
This paper discusses fabrication and characterization of single-walled carbon nanotube (SWNT) AFM...
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Thu, Apr 14 2011
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45
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0
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Dimension FastScan AFM - The World's Fastest Atomic Force...
Our new Dimension FastScan Atomic Force Microscope (the world's fastest AFM ) will enable you...
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Mon, May 2 2011
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20
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0
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Dimension FastScan Brochure
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Mon, May 2 2011
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67
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BioScope Catalyst Perfusing Stage Incubator
Brochure describing Bruker's BioScope Catalyst Perfusing Stage Incubator accessory.
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Wed, May 5 2010
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44
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0
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In-Line Measurement of CMP Divot
Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...
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Tue, May 11 2010
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39
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0
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Webinar Video - An Introduction to CD Metrology in the Semiconductor...
The AFM Webinar Series: An Introduction to CD Metrology in the Semiconductor Industry OVERVIEW As...
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Tue, May 18 2010
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50
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Webinar PDF Slides - An Introduction to CD Metrology in...
The AFM Webinar Series - PDF Slides: An Introduction to CD Metrology in the Semiconductor Industry...
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Tue, May 18 2010
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97
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Webinar Video - A First In-Depth Look at the New Dimension...
The Atomic Force Microscopy Webinar Series - Recording: A First In-Depth Look at the New Dimension®...
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Wed, May 19 2010
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35
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Webinar Video - Recent progress in AFM/IOM Combination ...
The Atomic Force Microscopy Webinar Series: Recent progress in AFM/IOM Combination - Highlights...
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Thu, May 20 2010
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23
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Celgard imaged at ~20um/s with Bruker Dimesnion FastScan
Nothing like a quality sample preparation (thanks Natalia!) and an awesome AFM to get great soft...
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Fri, May 6 2011
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42
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0
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Celgard(R) Imaged at 44um/s (22Hz) with Dimension FastScan
It’s good to see some community attempts at replicating the performance of the Dimension FastScan...
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Sat, Jun 11 2011
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2
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0
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