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NanoScope Analysis v1.40r1
NanoScope Analysis is a software package for analyzing SPM data (images, ramp data, HSDC, etc.)...
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Fri, Jul 30 2010
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15,071
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15
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AFM-Raman Solutions
Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just...
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Wed, Jul 7 2010
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90
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0
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Single pass EFM / surface potential with Nanoscope V
This Support Note describes a procedure to take electric force and surface potential measurements...
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Tue, Jul 6 2010
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280
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0
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NanoLithography Support Note 316, Revision A
This support note details NanoLithography theory, NanoScript™ syntax for performing lithography...
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Tue, Jul 6 2010
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1,350
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0
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HarmoniXTM Microscopy for Materials Characterization
By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy...
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Tue, Jul 6 2010
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79
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0
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Preparation of Silanized Mica for DNA Imaging
A detailed procedure for the preparation of silanized mica (AP-mica) as a substrate for DNA imaging...
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Wed, Jun 30 2010
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4,950
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0
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DNA Sample Preparation for High Resolution AFM Imaging
A detailed procedure for immobilizing DNA on a mica substrate using NiCl2-containing buffer solutions...
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Wed, Jun 30 2010
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1,751
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0
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Webinar Video - AFM: Characterizing Biomaterials at the...
AFM Webinar Series: Atomic Force Microscopy: Characterizing Biomaterials at the Nanoscale OVERVIEW...
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Tue, Jun 22 2010
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178
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0
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Webinar Video - 3D Optical Surface Profilometry and AFM...
A Special, Cross-Platform, 3D Optical Surface Profilometry and Atomic Force Microscopy Webinar:...
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Tue, Jun 22 2010
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55
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0
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Multiple Force Curves Without Scanning
This document describes how to use the Point and Shoot function to measure multiple force curves...
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Fri, Jun 4 2010
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237
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0
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Chemical Compatibility List
This table is a compilation of chemical compatibilities of a quite comprehensive list of chemicals...
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Fri, Jun 4 2010
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86
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0
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Webinar Video - Pharmaceutical Applications of the Atomic...
The Atomic Force Microscopy Webinar Series: Pharmaceutical Applications of the Atomic Force Microscope...
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Fri, Jun 4 2010
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81
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0
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Igor procedure to read High Speed Data Capture Data into...
Igor function to read a Nanoscope High Speed Data Capture (HSDC) file and load the data into Igor...
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Thu, Jun 3 2010
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1,305
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0
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3D Atomic Force Microscopy as an Alternative to X-SEM and...
Normal 0 false false false MicrosoftInternetExplorer4 Atomic force microscopy (AFM), on the other...
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Tue, May 25 2010
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188
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0
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Webinar Video - High-Resolution Imaging and Quantitative...
The Atomic Force Microscopy Webinar Series: High-Resolution Imaging and Quantitative Nanomechanical...
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Thu, May 20 2010
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162
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0
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Webinar Video - Recent progress in AFM/IOM Combination ...
The Atomic Force Microscopy Webinar Series: Recent progress in AFM/IOM Combination - Highlights...
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Thu, May 20 2010
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23
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0
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Webinar Video - A First In-Depth Look at the New Dimension...
The Atomic Force Microscopy Webinar Series - Recording: A First In-Depth Look at the New Dimension®...
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Wed, May 19 2010
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35
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0
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Webinar PDF Slides - An Introduction to CD Metrology in...
The AFM Webinar Series - PDF Slides: An Introduction to CD Metrology in the Semiconductor Industry...
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Tue, May 18 2010
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97
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0
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Webinar Video - An Introduction to CD Metrology in the Semiconductor...
The AFM Webinar Series: An Introduction to CD Metrology in the Semiconductor Industry OVERVIEW As...
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Tue, May 18 2010
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50
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0
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In-Line Measurement of CMP Divot
Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...
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Tue, May 11 2010
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39
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0
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