The Nanoscale World

Media

Name Date Downloads Comments
NanoScope Analysis v1.40r1
NanoScope Analysis is a software package for analyzing SPM data (images, ramp data, HSDC, etc.)...
Fri, Jul 30 2010 13,649 15
AFM-Raman Solutions
Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just...
Wed, Jul 7 2010 90 0
Single pass EFM / surface potential with Nanoscope V
This Support Note describes a procedure to take electric force and surface potential measurements...
Tue, Jul 6 2010 280 0
NanoLithography Support Note 316, Revision A
This support note details NanoLithography theory, NanoScript™ syntax for performing lithography...
Tue, Jul 6 2010 1,310 0
HarmoniXTM Microscopy for Materials Characterization
By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy...
Tue, Jul 6 2010 79 0
Preparation of Silanized Mica for DNA Imaging
A detailed procedure for the preparation of silanized mica (AP-mica) as a substrate for DNA imaging...
Wed, Jun 30 2010 4,908 0
DNA Sample Preparation for High Resolution AFM Imaging
A detailed procedure for immobilizing DNA on a mica substrate using NiCl2-containing buffer solutions...
Wed, Jun 30 2010 1,706 0
Webinar Video - AFM: Characterizing Biomaterials at the...
AFM Webinar Series: Atomic Force Microscopy: Characterizing Biomaterials at the Nanoscale OVERVIEW...
Tue, Jun 22 2010 178 0
Webinar Video - 3D Optical Surface Profilometry and AFM...
A Special, Cross-Platform, 3D Optical Surface Profilometry and Atomic Force Microscopy Webinar:...
Tue, Jun 22 2010 55 0
Multiple Force Curves Without Scanning
This document describes how to use the Point and Shoot function to measure multiple force curves...
Fri, Jun 4 2010 237 0
Chemical Compatibility List
This table is a compilation of chemical compatibilities of a quite comprehensive list of chemicals...
Fri, Jun 4 2010 85 0
Webinar Video - Pharmaceutical Applications of the Atomic...
The Atomic Force Microscopy Webinar Series: Pharmaceutical Applications of the Atomic Force Microscope...
Fri, Jun 4 2010 81 0
Igor procedure to read High Speed Data Capture Data into...
Igor function to read a Nanoscope High Speed Data Capture (HSDC) file and load the data into Igor...
Thu, Jun 3 2010 1,260 0
3D Atomic Force Microscopy as an Alternative to X-SEM and...
Normal 0 false false false MicrosoftInternetExplorer4 Atomic force microscopy (AFM), on the other...
Tue, May 25 2010 188 0
Webinar Video - High-Resolution Imaging and Quantitative...
The Atomic Force Microscopy Webinar Series: High-Resolution Imaging and Quantitative Nanomechanical...
Thu, May 20 2010 162 0
Webinar Video - Recent progress in AFM/IOM Combination ...
The Atomic Force Microscopy Webinar Series: Recent progress in AFM/IOM Combination - Highlights...
Thu, May 20 2010 23 0
Webinar Video - A First In-Depth Look at the New Dimension...
The Atomic Force Microscopy Webinar Series - Recording: A First In-Depth Look at the New Dimension®...
Wed, May 19 2010 35 0
Webinar PDF Slides - An Introduction to CD Metrology in...
The AFM Webinar Series - PDF Slides: An Introduction to CD Metrology in the Semiconductor Industry...
Tue, May 18 2010 97 0
Webinar Video - An Introduction to CD Metrology in the Semiconductor...
The AFM Webinar Series: An Introduction to CD Metrology in the Semiconductor Industry OVERVIEW As...
Tue, May 18 2010 50 0
In-Line Measurement of CMP Divot
Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...
Tue, May 11 2010 39 0
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