	Date	Downloads	Comments
Advances in Combined Atomic Force and Raman Microscopy by Bruker Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about...	Mon, Oct 24 2011	51	0
Quantitative Imaging of Living Biological Samples PeakForceQNM... by Stephen Minne It is now well established that measuring ex vivo the mechanical properties of living cells can...	Wed, Sep 7 2011	50	0
SPM Training Notebook 004-130-000 by Stephen Minne This Notebook is intended to be used as an introduction by the first-time user of Veeco Instruments...	Wed, Jul 13 2011	92	0
Survey, Screening, Dynamics: A No-Compromise Approach to... by Stephen Minne When compared to other common microscopy techniques (optical, SEM, TEM), the atomic force microscope’s...	Fri, Jul 8 2011	17	0
Introduction to Bruker’s ScanAsyst and PeakForce Tapping... by Stephen Minne PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM)...	Mon, May 2 2011	219	1
PeakForce TUNA - Simultaneous Electrical and Mechanical... AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization...	Sat, Mar 12 2011	66	0
Scanning Probe Microscopy Modes, Techniques and Operation... From SPM Operation to Critical Dimension Atomic Force Microscopy, this poster is a perfect companion...	Fri, Jan 28 2011	103	0
Single pass EFM / surface potential with Nanoscope V by Chunzeng Li This Support Note describes a procedure to take electric force and surface potential measurements...	Tue, Jul 6 2010	170	0
HarmoniXTM Microscopy for Materials Characterization by Stephen Minne By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy...	Tue, Jul 6 2010	50	0
Multiple Force Curves Without Scanning by Mikala Shremshock This document describes how to use the Point and Shoot function to measure multiple force curves...	Fri, Jun 4 2010	141	0
3D Atomic Force Microscopy as an Alternative to X-SEM and... by SeanHand Normal 0 false false false MicrosoftInternetExplorer4 Atomic force microscopy (AFM), on the other...	Tue, May 25 2010	131	0
In-Line Measurement of CMP Divot by Dean Dawson Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...	Tue, May 11 2010	18	0
Quantitative Mechanical Property Mapping at the Nanoscale... by Bede Pittenger The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical...	Thu, Apr 15 2010	246	2
TappingMode Atomic Force Microscopy Operation in Fluid by BrukerApplications Many of the biological samples suitable for imaging with atomic force microscopy (AFM) are subject...	Wed, Jan 6 2010	120	0
Atomic Force Microscopy of Microbial Cells by BrukerApplications Atomic force microscopy (AFM) has opened exciting new avenues in microbiology and biophysics for...	Wed, Jan 6 2010	65	0
Atomic Force Microscopy in the Pharmaceutical Sciences:... by BrukerApplications AFM has contributed to ground-breaking research in the investigation of DNA, proteins, and cells...	Wed, Jan 6 2010	81	0
3D MEMS Metrology with the Atomic Force Microscope by BrukerApplications Veeco Metrology Group, through its Digital Instruments and TM Microscopes divisions, offers several...	Wed, Jan 6 2010	30	0
Using AFM in Pharmaceutical Studies of Drug Crystal Growth... by BrukerApplications Microscopic evaluation is important for the design and evaluation of a pharmaceutical product after...	Wed, Jan 6 2010	51	0
Atomic Force Microscopy in the Investigation of Gene Delivery... by BrukerApplications Atomic force microscopy (AFM) provides the ability to perform three-dimensional measurements of...	Wed, Jan 6 2010	33	0
Investigating Nanorobotics and Nanostructure Formation with... by BrukerApplications Atomic force microscopes (AFMs) are most often used for high-resolution imaging and detailed surface...	Wed, Jan 6 2010	28	0

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