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Easy AFM: Atomic Force Microscopy made simple.
. Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface...
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Mon, Jan 4 2010
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135
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0
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Electrical testing of soft delicate samples using Torsional...
Scanning tunneling microscopy (STM) employs a biased sharp metal probe in close proximity to a surface...
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Mon, Jan 4 2010
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75
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0
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Force Resolution in Force Spectroscopy Experiments: Thermal...
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Mon, Jan 4 2010
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136
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0
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Functional Imaging
There is great interest in unraveling action mechanisms of key enzymes in biological processes....
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Wed, Dec 16 2009
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70
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0
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HarmoniXTM Microscopy for Materials Characterization
By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy...
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Tue, Jul 6 2010
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79
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0
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High Resolution Origami DNA Imaging with the MultiMode8
As part of a project involving the manipulation and control of matter at the nanoscale, Boise State...
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Mon, Feb 2 2015
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22
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0
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Imaging the full double helix structure of DNA
This application note describes in detail how to resolve the major and minor groove of the DNA double...
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Thu, Jun 4 2015
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26
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0
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In Line Monitoring of Shallow Trench Isolation Divot Depth
Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...
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Mon, Jan 4 2010
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32
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0
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In-Line Measurement of CMP Divot
Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...
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Tue, May 11 2010
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39
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0
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Introduction to Bruker’s ScanAsyst and PeakForce Tapping...
PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM)...
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Mon, May 2 2011
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563
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1
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Investigating Nanorobotics and Nanostructure Formation with...
Atomic force microscopes (AFMs) are most often used for high-resolution imaging and detailed surface...
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Wed, Jan 6 2010
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54
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0
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MIRO 2.0 for BioScope Catalyst
The new MIRO 2.0 (Microscope Image Registration and Overlay) software completes the compromise-free...
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Tue, Dec 29 2009
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58
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0
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Multiple Force Curves Without Scanning
This document describes how to use the Point and Shoot function to measure multiple force curves...
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Fri, Jun 4 2010
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237
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0
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Nanoscale Charge Trasnsport in Light Emitting Diode Materials...
Conducting atomic force microscopy (C-AFM) is an important technique in the study nanoscale charge...
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Wed, Dec 16 2009
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90
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0
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Nanoscale Thermal Analysis: Quantitative Nanoscale Characterization...
The VITA module enables nanoscale thermal analysis (nTA), a novel technique that allows the determination...
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Tue, Dec 29 2009
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762
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0
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NanoScope Software Tools for Force Spectroscopy Data Analysis
The atomic force microscope (AFM) offers extraordinarily high resolution in force measurement applications...
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Mon, Jan 4 2010
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288
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0
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PeakForce KPFM
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad...
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Tue, Jun 4 2013
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114
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0
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PeakForce TUNA - Simultaneous Electrical and Mechanical...
AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization...
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Sat, Mar 12 2011
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300
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0
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Practical Advice on the Determination of Cantilever Spring...
Atomic force microscopy (AFM) is being used in a great variety of force measurement applications...
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Mon, Jan 4 2010
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505
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0
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Probing DNA-Protein Interactions with Atomic Force Microscopy
Large, multi-component protein assemblies are involved in many DNA transactions such as recombination...
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Mon, Jan 4 2010
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72
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0
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