|
PeakForce KPFM
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad...
|
Tue, Jun 4 2013
|
114
|
0
|
|
Toward Quantitative Nanomechanical Measurements on Live...
Measuring and mapping mechanical properties of live cells is of high importance in today’s...
|
Fri, Sep 6 2013
|
68
|
0
|
|
High Resolution Origami DNA Imaging with the MultiMode8
As part of a project involving the manipulation and control of matter at the nanoscale, Boise State...
|
Mon, Feb 2 2015
|
22
|
0
|
|
Imaging the full double helix structure of DNA
This application note describes in detail how to resolve the major and minor groove of the DNA double...
|
Thu, Jun 4 2015
|
26
|
0
|
|
In-Line Measurement of CMP Divot
Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...
|
Tue, May 11 2010
|
39
|
0
|
|
3D Atomic Force Microscopy as an Alternative to X-SEM and...
Normal 0 false false false MicrosoftInternetExplorer4 Atomic force microscopy (AFM), on the other...
|
Tue, May 25 2010
|
188
|
0
|
|
Multiple Force Curves Without Scanning
This document describes how to use the Point and Shoot function to measure multiple force curves...
|
Fri, Jun 4 2010
|
237
|
0
|
|
HarmoniXTM Microscopy for Materials Characterization
By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy...
|
Tue, Jul 6 2010
|
79
|
0
|
|
Single pass EFM / surface potential with Nanoscope V
This Support Note describes a procedure to take electric force and surface potential measurements...
|
Tue, Jul 6 2010
|
280
|
0
|
|
Scanning Probe Microscopy Modes, Techniques and Operation...
From SPM Operation to Critical Dimension Atomic Force Microscopy, this poster is a perfect companion...
|
Fri, Jan 28 2011
|
394
|
0
|
|
PeakForce TUNA - Simultaneous Electrical and Mechanical...
AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization...
|
Sat, Mar 12 2011
|
300
|
0
|
|
Nanoscale Charge Trasnsport in Light Emitting Diode Materials...
Conducting atomic force microscopy (C-AFM) is an important technique in the study nanoscale charge...
|
Wed, Dec 16 2009
|
90
|
0
|
|
Functional Imaging
There is great interest in unraveling action mechanisms of key enzymes in biological processes....
|
Wed, Dec 16 2009
|
70
|
0
|