The Nanoscale World

Application Notes

Name Date Downloads Comments
Quantitative Mechanical Property Mapping at the Nanoscale...
The atomic force microscope (AFM) has long been recognized as a useful tool for measuring mechanical...
Thu, Apr 15 2010 537 2
Introduction to Bruker’s ScanAsyst and PeakForce Tapping...
PeakForce Tapping™ (PFT) and ScanAsyst™ (SA) are two Atomic Force Microsocope (AFM)...
Mon, May 2 2011 556 1
Advances in Combined Atomic Force and Raman Microscopy
Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about...
Mon, Oct 24 2011 157 0
Single pass EFM / surface potential with Nanoscope V
This Support Note describes a procedure to take electric force and surface potential measurements...
Tue, Jul 6 2010 278 0
PeakForce TUNA - Simultaneous Electrical and Mechanical...
AFM -based conductivity measurements are a powerful technique for nanometer-scale electrical characterization...
Sat, Mar 12 2011 297 0
Raman and TERS Application Note
Applications note #139 “AFM and Raman Spectroscopy – Correlated Imaging and Tip Enhanced...
Mon, Feb 25 2013 114 0
PeakForce KPFM
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad...
Tue, Jun 4 2013 109 0
Toward Quantitative Nanomechanical Measurements on Live...
Measuring and mapping mechanical properties of live cells is of high importance in today’s...
Fri, Sep 6 2013 67 0
High Resolution Origami DNA Imaging with the MultiMode8
As part of a project involving the manipulation and control of matter at the nanoscale, Boise State...
Mon, Feb 2 2015 22 0
Imaging the full double helix structure of DNA
This application note describes in detail how to resolve the major and minor groove of the DNA double...
Thu, Jun 4 2015 24 0
Scanning Probe Microscopy Modes, Techniques and Operation...
From SPM Operation to Critical Dimension Atomic Force Microscopy, this poster is a perfect companion...
Fri, Jan 28 2011 386 0
Survey, Screening, Dynamics: A No-Compromise Approach to...
When compared to other common microscopy techniques (optical, SEM, TEM), the atomic force microscope’s...
Fri, Jul 8 2011 48 0
SPM Training Notebook 004-130-000
This Notebook is intended to be used as an introduction by the first-time user of Veeco Instruments...
Wed, Jul 13 2011 316 0
Quantitative Imaging of Living Biological Samples PeakForceQNM...
It is now well established that measuring ex vivo the mechanical properties of living cells can...
Wed, Sep 7 2011 178 0
In-Line Measurement of CMP Divot
Atomic Force Microscopy (AFM) is a well-established metrology technique used in semiconductor at...
Tue, May 11 2010 39 0
3D Atomic Force Microscopy as an Alternative to X-SEM and...
Normal 0 false false false MicrosoftInternetExplorer4 Atomic force microscopy (AFM), on the other...
Tue, May 25 2010 188 0
Multiple Force Curves Without Scanning
This document describes how to use the Point and Shoot function to measure multiple force curves...
Fri, Jun 4 2010 233 0
HarmoniXTM Microscopy for Materials Characterization
By: Bede Pittenger This application note discusses HarmoniX, a new mode of atomic force microscopy...
Tue, Jul 6 2010 78 0
Nanoscale Charge Trasnsport in Light Emitting Diode Materials...
Conducting atomic force microscopy (C-AFM) is an important technique in the study nanoscale charge...
Wed, Dec 16 2009 89 0
Functional Imaging
There is great interest in unraveling action mechanisms of key enzymes in biological processes....
Wed, Dec 16 2009 70 0
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