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TappingModeTM imaging has proved to be
the most versatile mode of atomic force microscopy (AFM) in ambient conditions
where the presence of a fluid layer (condensed water vapor and other
contaminants) severely limits the applicability of both, contact mode and non-contact techniques. Overcoming
the challenges posed by friction, adhesion, and other issues, TappingMode has
provided a means of greatly extending AFM applications.
With TappingMode phase
imaging, the Caliber system can efficiently map variations in sample properties at
high resolution.