The Nanoscale World

Advanced Nanoscale Characterization with diCaliberTM Phase Imaging of Polymer Materials


Mon, Jan 4 2010

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Advanced Nanoscale Characterization with diCaliberTM Phase Imaging of Polymer Materials

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TappingModeTM imaging has proved to be the most versatile mode of atomic force microscopy (AFM) in ambient conditions where the presence of a fluid layer (condensed water vapor and other contaminants) severely limits the applicability of both, contact mode and non-contact techniques. Overcoming the challenges posed by friction, adhesion, and other issues, TappingMode has provided a means of greatly extending AFM applications. With TappingMode phase imaging, the Caliber system can efficiently map variations in sample properties at high resolution.

 

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