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  • Dimension FastScan

    Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible with other commercial AFM systems. It is simply
    Posted to SPM Digest (Forum) by Hector Lara on Mon, May 2 2011
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