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  • Seeing at the Nanoscale is coming to a Venue Near You

    Innovation with Integrity Seeing at the Nanoscale Is Coming to a Venue Near You April 2013 After over a decade of extremely popular once-a-year conferences, Seeing at the Nanoscale is expanding to multiple locations in 2013. The year-on-year growing participation, interest, and valued interactions were a strong catalyst for Bruker's new regional
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
  • Seeing at the Nanoscale 2013 with Nuance

    Seeing at the Nanoscale 2013 with Nuance Don’t miss this opportunity to meet your peers, discover next-generation nanotechnology, and be the first to hear about the exciting trends and industry updates. This year’s conference features an incredible mix of visionaries—all ready to give you an insider’s view on the future of nanotechnology
    Posted to Events (Forum) by Tracy Krainer on Thu, Feb 21 2013
  • October 2011, Issue 3 - Product Innovations. The World's Fastest AFM - Dimension FastScan

    October 2011, Issue 03 Product Innovations - Industry Leaders are Talking Dimension FastScan The Dimension FastScan improves imaging speed without sacrificing nanoscale resolution, enabling users to work hundreds of times faster than is possible with other commercial AFM systems and delivering results in seconds or minutes instead of hours or days.
    Posted to Nanovations (Forum) by Anonymous on Thu, Oct 20 2011
  • AFM Webinar Series, May 2011 - High Speed AFM Imaging

    The Dimension FastScan ™ Atomic Force Microscope (AFM) delivers, for the first time, extreme imaging speed without loss of resolution, loss of force control, added complexity, or additional operating costs Atomic Force Microscopy Webinar Series High Speed AFM Imaging: Bruker Dimension FastScan — a Breakthrough in AFM Technology Survey, Screening
    Posted to Events (Forum) by Anonymous on Thu, May 19 2011
  • Dimension FastScan

    Today Bruker Nano Surfaces Division announced the innovative and unique Dimension FastScan AFM, which delivers a significant breakthrough in improved imaging speed without sacrificing nanoscale resolution. The Dimension FastScan enables users to obtain usable data significantly faster than is possible with other commercial AFM systems. It is simply
    Posted to SPM Digest (Forum) by Hector Lara on Mon, May 2 2011
  • Bruker Completes Acquisition of the Atomic Force Microscopy and Optical Industrial Metrology Instruments Businesses from Veeco

    BILLERICA, Mass., Oct 07, 2010 (BUSINESS WIRE) -- Bruker Corporation (NASDAQ: BRKR) today announced the closing of its acquisition of the Atomic Force Microscopy (AFM) and the Optical Industrial Metrology (OIM) instruments businesses from Veeco Instruments, Inc. (NASDAQ: VECO) for $229.4 million in cash. The industry-leading AFM scientific instruments
    Posted to News (Forum) by Anonymous on Wed, Oct 27 2010
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