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  • Enabling AFM Advancement

    Innovation with Integrity Enabling AFM Advancement April 2013 David Rossi Executive Vice President and General Manager Bruker's AFM Business Topographic map of graphene flake prepared on silicon dioxide, reveals expected 300pm graphene step between successive layers. In the discipline of Tip-Enhanced Raman Spectroscopy (TERS), we continue to introduce
    Posted to Nanovations (Forum) by Tracy Krainer on Thu, Apr 4 2013
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