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Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of
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Kelvin probe force microscopy (KPFM, also known as surface potential microscopy) measures the work function, or electric potential, of materials or charges on the nanometer length scale. Despite much effort, KPFM has suffered from its inability to obtain consistent measurements of absolute work-functions in ambient conditions. Contamination, oxidation
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Innova-IRIS AFM-Raman Research Platform.
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Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition of a sample. When these techniques are further
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Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about the surface properties of a sample, yet their respective user base is often quite different. There are many important application reasons to combine these two technologies, and this application note looks both at the complementary information gained from
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The Atomic Force Microscopy Webinar Series - Recording: A First In-Depth Look at the New Dimension® Edge™ AFM System and its Applications Overview Learn all about the new Dimension Edge Atomic Force Microscope (AFM) Closed-Loop system and its applications. The Dimension Edge leverages many Veeco innovations to provide solid performance in
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Veeco Metrology Group, through its Digital Instruments and TM Microscopes divisions, offers several lines of scanning probe microscopes (SPM) capable of atomic force microscopy (AFM). Large sample stage AFMs can handle full-size MEMS wafers, and offer a range of automation options for the production fab. Small sample stage AFMs, with fewer automation
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Atomic force microscopy (AFM) provides the ability to perform three-dimensional measurements of surface structures at nanometer-to-subangstrom resolution in ambient and liquid environments. These capabilities have led to ground-breaking life sciences advances in the investigation of DNA, proteins, and cells.1 In particular, pharmaceutical research involves
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Atomic force microscopes (AFMs) are most often used for high-resolution imaging and detailed surface characterization, but soon after their invention it was recognized that they could also be used to change, interact with, and control nanoscale matter. A well-known early example of this was the IBM logo written with Xenon atoms by Don Eigler‘s