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  • AFM-Raman Solutions Brochure

    Leading AFM-RamanTechnology Aided by proprietary Bruker technology, atomic force microscopy has advanced past providing just nanoscale topographical data to the quantitative characterization of electrical, thermal, and mechanical information of sample surfaces. Similarly, Raman spectroscopy has emerged as a direct, label-free nondestructive probe of
    Posted to Brochures & Data Sheets (MediaGallery) by Tracy Krainer on Tue, May 14 2013
  • Dimension Icon AFM-Raman

    Today’s requirements on micro- and nanoscale characterization instrumentation go far beyond the capabilities of a single measurement method. The complimentary techniques of atomic force microscopy and Raman microscopy provide critical information on both the topography and the chemical composition of a sample. When these techniques are further
    Posted to Brochures & Data Sheets (MediaGallery) by Bruker on Mon, Oct 24 2011
  • Advances in Combined Atomic Force and Raman Microscopy

    Atomic force microscopy and Raman spectroscopy are both techniques used to gather information about the surface properties of a sample, yet their respective user base is often quite different. There are many important application reasons to combine these two technologies, and this application note looks both at the complementary information gained from
    Posted to Application Notes (MediaGallery) by Bruker on Mon, Oct 24 2011
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