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  • Easy AFM: Atomic Force Microscopy made simple.

    . Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the process of mounting cantilevers and the alignment
    Posted to Application Notes (MediaGallery) by BrukerApplications on Mon, Jan 4 2010
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