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Diminshing feature size, combined with requirements for higher throughput during quality control, have steadily increased demand for Critical Dimension Atomic Force Microscopy (CD AFM). In contrast to Scanning Electron Microscopy (SEM), the CD AFM provides a solution for nondestructive and rapid 3-dimensional measurementof features with 1.5nm 3s repeatability
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Atomic force microscopy (AFM) is being used in a great variety of force measurement applications, including investigating the unfolding pathways of native membrane proteins, probing the structure of single polysaccharide molecules, and monitoring the response of living cells to biochemical stimuli. All of these techniques rely on the accurate determination