-
-
. Designed with the infrequent or novice user in mind, Easy AFM® provides a single interface that presents the user with all of the inputs required to obtain high quality Tapping Mode® images on a majority of samples in air. Two of the hardest things for new users to become familiar with is the process of mounting cantilevers and the alignment
-
Bruker’s Dimension Icon Atomic Force Microscope (AFM) System introduces new levels of performance, functionality, and AFM accessibility to nanoscale researchers in science and industry. Building upon the world’s most utilized largesample AFM platform, the latest Dimension system is the culmination of decades of technological innovation,
-
Conducting atomic force microscopy (C-AFM) is an important technique in the study nanoscale charge transport properties of materials, and is of interest in the growing field of energy-related research. Conjugated polyelectrolytes (CPEs) are a particularly interesting class of materials, as they have been used in multiple applications such as an optical